Subscribe! eNewsletter Magazines About Us  |  Advertise  |  Contact Us  |  Site Map
advertisement
advertisement
Top

Chip Forensics

HP optimizes low-cost processing for inkjet printheads
Aug 22 -- One of the most common and most ignored types of chips is on almost every desk in this electronic world of ours -- the inkjet printhead. This edition of Chip Forensics examines a three-color printhead device out of Hewlett Packard's low-cost HP 60 Tricolor ink cartridge launched earlier this year....
 
Two different approaches to integrated MEMS
May 07 -- by Dick James, Senior Technology Advisor, Chipworks
May 12, 2008 - After the 45nm hype of the last few months, let's go to the other end of the CMOS scale and examine some interesting MEMS devices that are leading the penetration into new markets like consumer electronics -- and would not have been manufacturable without the deep etching processes that have evolved over the last few years....
 
SST November 2007: Intel's evolution: Strained silicon to high-k and metal gate
Oct 26 -- EXECUTIVE OVERVIEW As we head toward Intel's announced 45nm launch this month, Dick James looks at the changes from the company's 90nm node transistor, through the 65nm node, and take a few guesses about what we might see in the upcoming 45nm part....
 
SST September 2007: Looking inside Apple's iPhone: Rad-hard technology?
Sep 04 -- EXECUTIVE OVERVIEW In this edition of Chip Forensics, Dick James tears down Apple's 8GB iPhone, and the reverse engineering of a Peregrine RF switch similar to the one used by Apple within it, to look at the unusual silicon-on-sapphire (SoS) process used for its manufacture....
 
SST July 07: Samsung's NAND Flash evolution
Jul 06 -- EXECUTIVE OVERVIEW This month's edition of Chip Forensics by analyst Dick James delves into Flash technology, including the Samsung K9F2G08U0M 2-Gb single-level cell (SLC) Flash....
 
SST May 2007: FujiFilm Microdevices achieves a means of tweaking CCD sensitivity
May 01 -- EXECUTIVE OVERVIEW This monthâ??s edition of Chip Forensics by analyst Dick James delves into the manufacturing of a charged-coupled device (CCD) sensor for a FujiFilm digital camera with ISO 3200 sensitivity and 1/2000th sec shutter speed. He finds that the CCD, although a relatively simple structure in this nanotech era, is nicely optimized to do exactly what is required in a 6Mpixel camera....
 
SST March 2007: Freescale's process and fab strategy puts a new spin on MRAM
Mar 01 -- Freescale was recently honored with a product award for its magnetoresistive random access memory (MRAM) product, the Freescale MR2A16ATS35C 4-Mbit MRAM....
 
SST January 2007: Infineon uses vertical structure to optimize on-resistance in power MOS devices
Jan 18 -- Consumer products have become a leading technological and market driver of the semiconductor industry, fostering an ever-increasing demand for power density in devices targeted for that segment....
 
 

advertisements